Abstract:
This paper presents an efficient algorithm to control and reduce the sub-threshold leakage
current at nanoscale transistor level. The proposed algorithm called fast input vector
algorithm (FIVA) is based on input vector control (IVC) technique. Simulation results showed
that the proposed algorithm is faster than other algorithms implemented using the same
technique. The speed of the algorithm increases by increasing the number of transistors
comparing with other algorithms having the same target